Module S2.3 - Microscopy
Lecturers:
Prof. Dr. Heintzmann, Prof. Dr. Jandt, Prof. Dr. Eggeling, Dr. Westermann, Dr. Wicker
Dates:
- Lectures: Friday 12.00 - 14.00 (Abbe Center of Photonics, SR2, Beutenberg-Campus)
- Seminar: Tuesday 16:00 - 18:00 (SR 102 Abbeanum, Fröbelstieg 1), every two weeks
Content:
| Week | Lecturer | Subject | Content |
|
1 |
Heintzmann | Basics, components |
Microscope system, system parts, objective lenses, Tube optics, 4f-setup |
|
2 |
Kempe | Instrumentation |
Illumination, Köhler principle, critical illumination, Stereo microscope |
| 3 27.04.2018 | Jandt | Atomic force microscopy |
Working modes, tip-sample interaction, scanners, probes, sample preparation, other scanning probe methods, SNOM |
|
4 04.05.2018 |
Eggeling | Contrasting methods |
Dark field, phase contrast, DIC, digital contrasts |
|
5 11.05.2018 |
Eggeling | Microscopic methods |
Polarization, fluorescence, FLIM, FRET |
|
6 18.05.2018 |
Heintzmann | Coherent image formation |
Image formation, Fourier optical approach, spatial resolution, diffraction and interference, impact of aberrations |
|
7 25.05.2018 |
Heintzmann | Confocal fluorescence microscopy | Confocal principle, resolution, laser scan microscope, two-photon excitation |
|
8 01.06.2018 |
Eggeling | Contrasting methods | Coherence, scattering, OCT principle |
|
9 08.06.2018 |
Wicker | Volume imaging | 3D transfer theory, McCutchen theorem |
|
10 15.06.2018 |
Wicker | Structured illumination | Sim Theory and Reconstruction |
|
11 22.06.2018 |
Eggeling | Single molecule localization and stimulated emission and depletion | PALM, STORM, dSTORM |
|
12 29.06.2018 |
Westermann | Electron microscopy | Transmission EM, scanning EM, electron microprobe analysis, correlative light and electron microscopy |
|
13 06.07.2018 |
Westermann |
Electron microscopy | Transmission EM, scanning EM, electron microprobe analysis, correlative light and electron microscopy |
|
14 |
Heintzmann | Further methods |
Deconvolution 2D/3D, 4 pi |